A Little Rough on the Edges...

Currently, I am sectioning my tarpon scale samples with a good ol' pair of scissors. No fancy sectioning equipment, at least, not yet. While scissors are simple and effective, SEM reveals the roughness of the section edge (see images). Considering that EDS analysis only penetrates about 50 uM into the sample, the large divots seen in the micrograph could be biasing results.

To remedy this, I have sanded the cut edges with silicon carbide sandpaper. Because the scope is currently down for periodic vacuum maintenance, I have yet to observe the sanding effect on the micro scale.

Because silicon is not naturally found in these scales, potential leftover sanding residue will not impact the analyses.